Developing better metrics for LED Manufacturing
Founded in 2000, Op-test has built and integrated spectral/optical and electrical testing in wafer probe, packaged test, and final test.
Dedicated to helping to provide the right tools to improve yield, Op-test has developed technologies to provide clarity and better metrics for LED/HBLED test systems.
History & Innovations
1999 – First Production HBLED Test System, Multi-dimensional Binning
2001 – Fabre-Perot Removal
2002 – Advanced Spectrometer NLC
2002 – 2π Fixturing in Production Test
2004 – Lit Die Optical Inspection
2011 – HBLED Controlled Energy Testing
2012 – Color Parameters
2013 – Film Uniformity Measurement
Contact us for more information on how we can meet your electrical/optical, and LED testing needs.