Op-Test at the Strategies in Light/LED Show March 1-3, 2016

Come see our booth and product demo at the LED Show, March 1-3, 2016. We will be located in the LED Show section, #1439. Entry into the Exhibit hall is free.


Op-Test Granted a Patent for C-Parameters

September 8, 2015 – Op-Test is awarded with U.S. Patent No. 9,128,144 titled, “System and Method of Quantifying Color and Intensity of Light Sources.” This marks the 2nd family of patents to be awarded to Op-Test for innovations in LED testing.

Patent granted in Taiwan for Controlled Energy Testing

On June 11, 2014, the Taiwan Intellectual Property Office has granted Sof-Tek Integrators, Inc. dba Op-Test, the parent company of Op-Test, a Taiwan (R.O.C) Letters Patent for Controlled Energy Testing as described in the patent titled, “System and Method of Testing High Brightness LED (HBLED)” which is based on U.S. Patent No. 8,593,148.